BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Coz Planner//NYCU//ZH-TW
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:NYCozU · VLSI測試與可測試性設計
BEGIN:VTIMEZONE
TZID:Asia/Taipei
X-LIC-LOCATION:Asia/Taipei
BEGIN:STANDARD
DTSTART:19700101T000000
TZOFFSETFROM:+0800
TZOFFSETTO:+0800
TZNAME:CST
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BEGIN:VEVENT
UID:eb84c2c9050d1d22f4a92997f2d238509a821d5a@coz.aa.nycu.edu.tw
DTSTAMP:20180215T160000Z
DTSTART;TZID=Asia/Taipei:20180219T101000
DTEND;TZID=Asia/Taipei:20180219T110000
RRULE:FREQ=WEEKLY;UNTIL=20180619T155959Z
SUMMARY:VLSI測試與可測試性設計 (5026)
LOCATION:ED301
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
BEGIN:VEVENT
UID:a264222c3bccba9538fa5a8849fc972341883ba0@coz.aa.nycu.edu.tw
DTSTAMP:20180215T160000Z
DTSTART;TZID=Asia/Taipei:20180219T111000
DTEND;TZID=Asia/Taipei:20180219T120000
RRULE:FREQ=WEEKLY;UNTIL=20180619T155959Z
SUMMARY:VLSI測試與可測試性設計 (5026)
LOCATION:ED301
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
BEGIN:VEVENT
UID:d4906be99c262f1c6f53a86c2c57ece823b7f57c@coz.aa.nycu.edu.tw
DTSTAMP:20180215T160000Z
DTSTART;TZID=Asia/Taipei:20180219T122000
DTEND;TZID=Asia/Taipei:20180219T131000
RRULE:FREQ=WEEKLY;UNTIL=20180619T155959Z
SUMMARY:VLSI測試與可測試性設計 (5026)
LOCATION:ED301
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
END:VCALENDAR