BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Coz Planner//NYCU//ZH-TW
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:NYCozU · VLSI測試與可測試性設計
BEGIN:VTIMEZONE
TZID:Asia/Taipei
X-LIC-LOCATION:Asia/Taipei
BEGIN:STANDARD
DTSTART:19700101T000000
TZOFFSETFROM:+0800
TZOFFSETTO:+0800
TZNAME:CST
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
UID:34c3cd9e7b3fdb26b972e39986d0d66fef19677e@coz.aa.nycu.edu.tw
DTSTAMP:20200907T160000Z
DTSTART;TZID=Asia/Taipei:20200910T153000
DTEND;TZID=Asia/Taipei:20200910T162000
RRULE:FREQ=WEEKLY;UNTIL=20210117T155959Z
SUMMARY:VLSI測試與可測試性設計 (5978)
LOCATION:ED220
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
BEGIN:VEVENT
UID:85c2199ef62862909cad867147bb28609e291029@coz.aa.nycu.edu.tw
DTSTAMP:20200907T160000Z
DTSTART;TZID=Asia/Taipei:20200910T163000
DTEND;TZID=Asia/Taipei:20200910T172000
RRULE:FREQ=WEEKLY;UNTIL=20210117T155959Z
SUMMARY:VLSI測試與可測試性設計 (5978)
LOCATION:ED220
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
BEGIN:VEVENT
UID:f7a1499429f078dbed069d99cf3636fa539e655e@coz.aa.nycu.edu.tw
DTSTAMP:20200907T160000Z
DTSTART;TZID=Asia/Taipei:20200910T173000
DTEND;TZID=Asia/Taipei:20200910T182000
RRULE:FREQ=WEEKLY;UNTIL=20210117T155959Z
SUMMARY:VLSI測試與可測試性設計 (5978)
LOCATION:ED220
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
END:VCALENDAR