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X-WR-CALNAME:NYCozU · VLSI測試與可測試性設計
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TZID:Asia/Taipei
X-LIC-LOCATION:Asia/Taipei
BEGIN:STANDARD
DTSTART:19700101T000000
TZOFFSETFROM:+0800
TZOFFSETTO:+0800
TZNAME:CST
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UID:23f11540e3ae1db0f0a184fd7bd7d549d7d11bd6@coz.aa.nycu.edu.tw
DTSTAMP:20220907T160000Z
DTSTART;TZID=Asia/Taipei:20220908T153000
DTEND;TZID=Asia/Taipei:20220908T162000
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SUMMARY:VLSI測試與可測試性設計 (535236)
LOCATION:EDB27
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
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UID:755445a921671560f66102b2091bfa360fb22379@coz.aa.nycu.edu.tw
DTSTAMP:20220907T160000Z
DTSTART;TZID=Asia/Taipei:20220908T163000
DTEND;TZID=Asia/Taipei:20220908T172000
RRULE:FREQ=WEEKLY;UNTIL=20230117T155959Z
SUMMARY:VLSI測試與可測試性設計 (535236)
LOCATION:EDB27
DESCRIPTION:授課老師：趙家佐\n學分：0
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DTSTAMP:20220907T160000Z
DTSTART;TZID=Asia/Taipei:20220908T173000
DTEND;TZID=Asia/Taipei:20220908T182000
RRULE:FREQ=WEEKLY;UNTIL=20230117T155959Z
SUMMARY:VLSI測試與可測試性設計 (535236)
LOCATION:EDB27
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
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