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PRODID:-//Coz Planner//NYCU//ZH-TW
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:NYCozU · VLSI測試與可測試性設計
BEGIN:VTIMEZONE
TZID:Asia/Taipei
X-LIC-LOCATION:Asia/Taipei
BEGIN:STANDARD
DTSTART:19700101T000000
TZOFFSETFROM:+0800
TZOFFSETTO:+0800
TZNAME:CST
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BEGIN:VEVENT
UID:b002b6a2b81b6318b583c5379578e8eac59077de@coz.aa.nycu.edu.tw
DTSTAMP:20230907T160000Z
DTSTART;TZID=Asia/Taipei:20230911T090000
DTEND;TZID=Asia/Taipei:20230911T095000
RRULE:FREQ=WEEKLY;UNTIL=20240117T155959Z
SUMMARY:VLSI測試與可測試性設計 (535233)
LOCATION:EDB06
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
BEGIN:VEVENT
UID:89a2ef1e862519ec65b1aca7a0c2a461d529d176@coz.aa.nycu.edu.tw
DTSTAMP:20230907T160000Z
DTSTART;TZID=Asia/Taipei:20230911T101000
DTEND;TZID=Asia/Taipei:20230911T110000
RRULE:FREQ=WEEKLY;UNTIL=20240117T155959Z
SUMMARY:VLSI測試與可測試性設計 (535233)
LOCATION:EDB06
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
BEGIN:VEVENT
UID:c06414cca654bd0237b8ca096314f1f729eeb8cd@coz.aa.nycu.edu.tw
DTSTAMP:20230907T160000Z
DTSTART;TZID=Asia/Taipei:20230911T111000
DTEND;TZID=Asia/Taipei:20230911T120000
RRULE:FREQ=WEEKLY;UNTIL=20240117T155959Z
SUMMARY:VLSI測試與可測試性設計 (535233)
LOCATION:EDB06
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
END:VCALENDAR