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X-WR-CALNAME:NYCozU · VLSI測試與可測試性設計
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TZID:Asia/Taipei
X-LIC-LOCATION:Asia/Taipei
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DTSTART:19700101T000000
TZOFFSETFROM:+0800
TZOFFSETTO:+0800
TZNAME:CST
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UID:d1d299f66e5f1aed63cd60f840b8c69da8450dbb@coz.aa.nycu.edu.tw
DTSTAMP:20240907T160000Z
DTSTART;TZID=Asia/Taipei:20240909T090000
DTEND;TZID=Asia/Taipei:20240909T095000
RRULE:FREQ=WEEKLY;UNTIL=20250117T155959Z
SUMMARY:VLSI測試與可測試性設計 (535225)
LOCATION:ED301
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
BEGIN:VEVENT
UID:cda1bb94a0f3aa8253abdfc9215d197dbe771477@coz.aa.nycu.edu.tw
DTSTAMP:20240907T160000Z
DTSTART;TZID=Asia/Taipei:20240909T101000
DTEND;TZID=Asia/Taipei:20240909T110000
RRULE:FREQ=WEEKLY;UNTIL=20250117T155959Z
SUMMARY:VLSI測試與可測試性設計 (535225)
LOCATION:ED301
DESCRIPTION:授課老師：趙家佐\n學分：0
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UID:86a646ab3fd8d7d1fdec975f184e0ba2f0ccd2aa@coz.aa.nycu.edu.tw
DTSTAMP:20240907T160000Z
DTSTART;TZID=Asia/Taipei:20240909T111000
DTEND;TZID=Asia/Taipei:20240909T120000
RRULE:FREQ=WEEKLY;UNTIL=20250117T155959Z
SUMMARY:VLSI測試與可測試性設計 (535225)
LOCATION:ED301
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
END:VCALENDAR