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PRODID:-//Coz Planner//NYCU//ZH-TW
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:NYCozU · VLSI測試與可測試性設計
BEGIN:VTIMEZONE
TZID:Asia/Taipei
X-LIC-LOCATION:Asia/Taipei
BEGIN:STANDARD
DTSTART:19700101T000000
TZOFFSETFROM:+0800
TZOFFSETTO:+0800
TZNAME:CST
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BEGIN:VEVENT
UID:5e466e938a042da1583bd8cbbce9c9f5e69e0900@coz.aa.nycu.edu.tw
DTSTAMP:20260907T160000Z
DTSTART;TZID=Asia/Taipei:20260914T090000
DTEND;TZID=Asia/Taipei:20260914T095000
RRULE:FREQ=WEEKLY;UNTIL=20270117T155959Z
SUMMARY:VLSI測試與可測試性設計 (535231)
LOCATION:ED301
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
BEGIN:VEVENT
UID:1c9755ae3ad182874084ee738a754a5fa5375970@coz.aa.nycu.edu.tw
DTSTAMP:20260907T160000Z
DTSTART;TZID=Asia/Taipei:20260914T101000
DTEND;TZID=Asia/Taipei:20260914T110000
RRULE:FREQ=WEEKLY;UNTIL=20270117T155959Z
SUMMARY:VLSI測試與可測試性設計 (535231)
LOCATION:ED301
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
BEGIN:VEVENT
UID:5f9b1b75097bb7763f55ef9c2b20b5dad29ef75d@coz.aa.nycu.edu.tw
DTSTAMP:20260907T160000Z
DTSTART;TZID=Asia/Taipei:20260914T111000
DTEND;TZID=Asia/Taipei:20260914T120000
RRULE:FREQ=WEEKLY;UNTIL=20270117T155959Z
SUMMARY:VLSI測試與可測試性設計 (535231)
LOCATION:ED301
DESCRIPTION:授課老師：趙家佐\n學分：0
END:VEVENT
END:VCALENDAR