材料分析
Material Analysis
| 節 | 週四 |
|---|---|
6 14:20–15:10 | 材料分析 ED202（光復） 3 節連堂 |
7 15:30–16:20 | |
8 16:30–17:20 |
* 根據陽明交大上課時間表所列
This class will teach students to analyze electronic devices using advanced material analysis methods. Students will gain an in-depth understanding of the physical, chemical, and structural properties of materials that influence device performance.
Basic physics concepts.
無備註
ChemSpider Search and share chemistry: http://www.chemspider.com/StructureSearch.aspx X-ray Absorption Edges: http://skuld.bmsc.washington.edu/scatter/AS_periodic.html American Mineralogist Crystal Structure Database: http://rruff.geo.arizona.edu/AMS/amcsd.php
Oral research topic presentation 30% Attend 20% Midterm exam 25% Final exam 25%
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| 週次 | 主題 |
|---|---|
| 第 1 週 | 課程介紹 |
| 第 2 週 | Light Microscopy |
| 第 3 週 | X-Ray Diffraction Methods |
| 第 4 週 | Transmission Electron Microscopy |
| 第 5 週 | Transmission Electron Microscopy |
| 第 6 週 | Scanning Electron Microscopy/Scanning Probe Microscopy |
| 第 7 週 | 放假(校際活動週) |
| 第 8 週 | Oral presentation |
| 第 9 週 | Midterm Exam |
| 第 10 週 | X-Ray Spectroscopy for Elemental Analysis |
| 第 11 週 | Electron Spectroscopy for Surface Analysis |
| 第 12 週 | Secondary Ion Mass Spectrometry for Surface Analysis |
| 第 13 週 | Vibrational Spectroscopy for Molecular Analysis |
| 第 14 週 | TSRI材料分析儀器參觀 |
| 第 15 週 | Oral presentation |
| 第 16 週 | Final Exam |
Materials characterization: introduction to microscopic and spectroscopic methods Leng, Y. (Yang) Weinheim, Germany: Wiley-VCH, c2013. 2nd ed.. c2013 Transmission electron microscopy: diffraction, imaging, and spectrometry Springer eBooks, Editors: Carter, Barry, Williams, David B. (Eds.) Cham: Springer International Publishing : Imprint: Springer, 2016. 2016
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